RIEGL will be participating as a Silver Sponsor and Exhibitor at the 2025 International Association of Forensic & Security Metrology (IAFSM) Conference, taking place November 2–5, 2025, at the Hilton San Diego Bayfront in San Diego, California.

RIEGL supports the forensic and security metrology community by providing advanced 3D scanning solutions. Conference attendees are invited to visit the RIEGL exhibit to explore how our high-performance systems are applied in crime scene reconstruction, crash investigation, and forensic visualization.

RIEGL technology will also be featured during the Alcatraz Scan Workshop, offering a hands-on look at how 3D laser scanning is used in complex forensic environments.

Participation in IAFSM 2025 reflects RIEGL’s ongoing commitment to innovation, precision, and collaboration in the field of forensic metrology.

Learn more about the event: www.iafsm.org